SANER 2020 Workshops
Workshops of the 2020 IEEE 27th International Conference on Software Analysis, Evolution, and Reengineering (SANER)
Powered by
Conference Publishing Consulting
2020 IEEE 2nd International Workshop on Intelligent Bug Fixing (IBF), February 18, 2020, London, ON, Canada

IBF 2020 – Proceedings

 Contents - Abstracts - Authors

2020 IEEE 2nd International Workshop on Intelligent Bug Fixing (IBF)

Frontmatter

Title Page
Message from the Chairs

Patches and Testing

Exploring the Differences between Plausible and Correct Patches at Fine-Grained Level
Bo Yang and Jinqiu Yang
(Concordia University, Canada)
Can This Fault Be Detected by Automated Test Generation: A Preliminary Study
Hangyuan Cheng, Ping Ma, Jingxuan Zhang, and Jifeng Xuan
(Wuhan University, China; Nanjing University of Aeronautics and Astronautics, China)
Utilizing Source Code Embeddings to Identify Correct Patches
Viktor Csuvik, Dániel Horváth, Ferenc Horváth, and László Vidács
(University of Szeged, Hungary)

Quality and Bugs

An Empirical Study of High-Impact Factors for Machine Learning-Based Vulnerability Detection
Wei Zheng, Jialiang Gao, Xiaoxue Wu, Yuxing Xun, Guoliang Liu, and Xiang Chen
(Northwestern Polytechnical University, China; Nantong University, China)
An Empirical Study of Bug Bounty Programs
Thomas Walshe and Andrew Simpson
(University of Oxford, UK)
Why Is My Bug Wontfix?
Qingye Wang
(Zhejiang University, China)
Blve: Should the Current Software Version Be Suitable for Release?
Wei Zheng, Xiaojun Chen, Manqing Zhang, Zhao Shi, Junzheng Chen, and Xiang Chen
(Northwestern Polytechnical University, China; Nantong University, China)

proc time: 0.01